[Debug] Add automatic device attribute dump on composition test failures#41020

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j-ororke wants to merge 21 commits intoproject-chip:masterfrom

j-ororke:create_global_attr_log_function

Commits on Sep 17, 2025

Add automatic device attribute dump on composition test failures:
j-ororke
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Restyled by autopep8

restyled-commits
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Remove duplicate on_fail() and unused import from TC_DeviceConformance
j-ororke
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Removing unused logging import
j-ororke
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Change inheritance order to enable automatic device attribute dump on composition test failures
j-ororke
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Restyled by autopep8

restyled-commits
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j-ororke
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resolving linting errors and making sure that on test failures we emit the failure msg correctly
j-ororke
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Restyled by autopep8

restyled-commits
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j-ororke
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Commits on Sep 24, 2025

Commits on Oct 1, 2025

Commits on Oct 16, 2025